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Changes


New and revised materials and properties in MPDB v9.63 as compared to v9.61


Key to property symbols (number of datasets):

D     = Density
DLL   = Linear thermal expansion (dL/L)
MTE   = Mean coefficient of thermal expansion
CTE   = Coefficient of thermal expansion (CTE)
E     = Elastic/Young's modulus
G     = Shear modulus
v     = Poisson's ratio
K     = Bulk modulus
TC    = Thermal conductivity
TD    = Thermal diffusivity
SH    = Specific heat
HC    = Heat capacity
SSC   = True stress-strain curve (tension)
SSCC  = True stress-strain curve (compression)
UTS   = Tensile strength
YS    = Yield strength (tension)
UCS   = Compressive strength
YSC   = Yield strength (compression)
%El   = Elongation
SR    = Stress rupture
FEN   = Fatigue e-N curve
FSN   = Fatigue S-N curve
CRS   = Creep strength
IC    = Isochronous creep
HE    = Hemispherical total emissivity
NE    = Normal total emissivity
VP    = Vapor pressure
Vis   = Viscosity
ST    = Surface tension
RHO   = Electrical resistivity
SIGMA = Electrical conductivity
SV    = Specific volume
AV    = Apparent viscosity
FM    = Flexural modulus
FS    = Flexural strength
ESSC  = Engineering stress-strain curve (tension)
ESSCC = Engineering stress-strain curve (compression)
CRM   = Creep modulus
RPB   = Relative permeability
AP    = Absolute permeability
BH    = B-H curve
HB    = H-B curve
CL    = Core loss
EP    = Exciting Power
DCRPT = Relative permittivity
DF    = Dissipation factor
RIW   = Refractive index vs WL
RIT   = Refractive index vs T
S     = Seebeck coefficient


N indicates the data is new, R indicates the data has been revised, * indicates the data is the RT value only

39 new materials, 412 new property sets, 43 revised properties, and 32 new RT values



321H (Revised) Al₂Fe₂.₅Co₀.₅Si₃ Al₂Fe₂.₆Co₀.₄Si₃ Al₂Fe₂.₇Co₀.₃Si₃ Al₂Fe₂.₇Mn₀.₃Si₃
Al₂Fe₂.₈Co₀.₂Si₃ Al₂Fe₂.₈Mn₀.₂Si₃ Al₂Fe₂.₉Co₀.₁Si₃ Al₂Fe₂.₉Mn₀.₁Si₃ Al₂Fe₂CoSi₃
Al₂Fe₃Si₃ Americium As₂Te₃ (New) ASME P92 (9 Cr - 0.5 Mo - 2 W (wt%)) Be₃N₂
Beryllium Bi₀.₅Sb₁.₅Te₃ (Revised) Bi₂Te₁.₉₅Se₁.₀₅ Bi₂Te₂.₀₁Se₀.₉₉ Bi₂Te₂.₁Se₀.₉
Bi₂Te₂.₂₅S₀.₇₅ (New) Bi₂Te₂.₄Se₀.₆ Bi₂Te₂.₅₅Se₀.₄₅ Bi₂Te₂.₅S₀.₅ (New) Bi₂Te₂.₇₅S₀.₂₅ (New)
Bi₂Te₂.₇Se₀.₃ Bi₂Te₂S (New) Bi₂Te₃ - 0.01 CuI - 0.005 Pb (New) Bi₂Te₃ - 0.01 CuI (New) Bi₂Te₃ - 0.01 FeTe₂ (New)
Bi₂Te₃ - 0.02 FeTe₂ (New) Bi₂Te₃ - 0.03 CuI - 0.015 Pb (New) Bi₂Te₃ - 0.03 FeTe₂ (New) Bi₂Te₃ - 0.04 FeTe₂ (New) Bi₂Te₃ - 0.05 CuI - 0.025 Pb (New)
Bi₂Te₃ - 0.07 CuI - 0.035 Pb (New) Bi₂Te₃ - 0.1 CuI - 0.05 Pb (New) Bi₂Te₃ Ce₀.₀₆Fe₀.₄₉Co₃.₅₁Sb₁₂ Ce₀.₀₈Fe₀.₃₉Co₃.₆₁Sb₁₂
Ce₀.₀₈Fe₀.₉Co₃.₁Sb₁₂ Ce₀.₁₂Fe₀.₇₁Co₃.₂₉Sb₁₂ Copper CoSb₃ + 2 wt% PbTe composite (New) CoSb₃ + 4 wt% PbTe composite (New)
CoSb₃ + 8 wt% PbTe composite (New) CoSb₃ Cu₀.₈CrS₂.₃ (New) Cu₀.₉CrS₂.₄ (New) Cu₃BiS₃
CuCo₂S₄ CuCrS₂.₁ (New) CuCrS₂.₂ (New) CuCrS₂ (New) Fe₀.₅₁Co₃.₄₉Sb₁₂
Fe₀.₉₂Co₃.₀₈Sb₁₂ Ge₂Sb₂Te₅ GeTe (New) Gold Inconel 601 (Revised)
Mg₁.₉₇Li₀.₀₃Si₀.₃Sn₀.₇ Mg₂.₀₆Si₀.₃Sn₀.₆₆₅Bi₀.₀₃₅ Mg₂.₀₆Si₀.₃Sn₀.₆₉₂₅Bi₀.₀₀₇₅ Mg₂Si₀.₅Ge₀.₅ (New) Mg₂Si₀.₅Ge₀.₅Sb₀.₀₀₅ (New)
Mg₂Si₀.₅Ge₀.₅Sb₀.₀₁ (New) Mg₂Si₀.₅Ge₀.₅Sb₀.₀₂ (New) Mg₂Si₀.₅Ge₀.₅Sb₀.₀₃ (New) Mn₃CuN (New) Mn₃Ga₀.₇Sn₀.₃N (New)
Mn₃InN (New) Molybdenum NaZnSb p-type Si₈₀Ge₂₀ (Revised) Palladium
PbTe Platinum Sb₂Te₃ Seawater (Revised) Silver
Stellite 27 (Revised) Stellite 31 (Revised) Stellite 3 (Revised) Ti₁₀Ru₁₉B₈ (New) Ti₉Co₂Ru₁₈B₈ (New)
Ti₉Cr₂Ru₁₈B₈ (New) Ti₉Cu₂Ru₁₈B₈ (New) Ti₉Fe₂Ru₁₈B₈ (New) Ti₉Mn₂Ru₁₈B₈ (New) Ti₉Ni₂Ru₁₈B₈ (New)
TiS₂:Sn₀.₀₅ TiS₂:Sn₀.₀₇₅ TiS₂:Sn₀.₁ TiS₂ Tungsten
UNS C10100 (OFE) UNS C10200 (OFHC/OF)


321H

    CRS    (R):    1% strain, annealed : Master curve (LMP) : 10317|30|0|3

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Al₂Fe₂.₅Co₀.₅Si₃

    S      (N):    solid : 14602|48|0|-1

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Al₂Fe₂.₆Co₀.₄Si₃

    S      (N):    solid : 14601|48|0|-1

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Al₂Fe₂.₇Co₀.₃Si₃

    S      (N):    solid : 14600|48|0|-1

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Al₂Fe₂.₇Mn₀.₃Si₃

    S      (N):    solid : 14606|48|0|-1

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Al₂Fe₂.₈Co₀.₂Si₃

    S      (N):    solid : 14599|48|0|-1

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Al₂Fe₂.₈Mn₀.₂Si₃

    S      (N):    solid : 14605|48|0|-1

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Al₂Fe₂.₉Co₀.₁Si₃

    S      (N):    solid : 14598|48|0|-1

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Al₂Fe₂.₉Mn₀.₁Si₃

    S      (N):    solid : 14604|48|0|-1

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Al₂Fe₂CoSi₃

    S      (N):    solid : 14603|48|0|-1

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Al₂Fe₃Si₃

    S      (N):    solid : 14597|48|0|-1

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Americium

    DLL    (N):    solid : polycrystal : 929|0|0|0
    DLL    (N):    solid : a-axis : 929|0|0|1
    DLL    (N):    solid : c-axis : 929|0|0|2
    MTE    (N):    solid : polycrystal : 929|8|0|0
    MTE    (N):    solid : a-axis : 929|8|0|1
    MTE    (N):    solid : c-axis : 929|8|0|2
    CTE    (N):    solid : polycrystal : 929|16|0|0
    CTE    (N):    solid : a-axis : 929|16|0|1
    CTE    (N):    solid : c-axis : 929|16|0|2
    D      (N):    solid : 929|24|0|-1

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As₂Te₃ (New)

    TC        :    alpha phase : parallel to the pressing direction : 15417|1|0|0
    TC        :    alpha phase : perpendicular to the pressing direction : 15417|1|0|1
    TC        :    alpha phase : average : 15417|1|0|2
    RHO       :    alpha phase : parallel to the pressing direction : 15417|2|0|0
    RHO       :    alpha phase : perpendicular to the pressing direction : 15417|2|0|1
    RHO       :    alpha phase : average : 15417|2|0|2
    SH        :    alpha phase : 15417|9|0|-1
    SIGMA     :    alpha phase : parallel to the pressing direction : 15417|10|0|0
    SIGMA     :    alpha phase : perpendicular to the pressing direction : 15417|10|0|1
    SIGMA     :    alpha phase : average : 15417|10|0|2
    HC        :    alpha phase : 15417|17|0|-1
    D     (*):    solid : 15417|24|0|-1
    TD        :    alpha phase : parallel to the pressing direction : 15417|25|0|0
    TD        :    alpha phase : perpendicular to the pressing direction : 15417|25|0|1
    TD        :    alpha phase : average : 15417|25|0|2
    S         :    alpha phase : parallel to the pressing direction : 15417|48|0|0
    S         :    alpha phase : perpendicular to the pressing direction : 15417|48|0|1
    S         :    alpha phase : average : 15417|48|0|2

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ASME P92 (9 Cr - 0.5 Mo - 2 W (wt%))

    SSCC   (N):    0.01/s : tested at 750 °C (1382 °F) : 1196|12|0|0
    SSCC   (N):    0.01/s : tested at 850 °C (1562 °F) : 1196|12|0|1
    SSCC   (N):    0.01/s : tested at 950 °C (1742 °F) : 1196|12|0|2
    SSCC   (N):    0.01/s : tested at 1050 °C (1922 °F) : 1196|12|0|3
    SSCC   (N):    0.01/s : tested at 1150 °C (2102 °F) : 1196|12|0|4
    SSCC   (N):    0.1/s : tested at 750 °C (1382 °F) : 1196|12|1|0
    SSCC   (N):    0.1/s : tested at 850 °C (1562 °F) : 1196|12|1|1
    SSCC   (N):    0.1/s : tested at 950 °C (1742 °F) : 1196|12|1|2
    SSCC   (N):    0.1/s : tested at 1050 °C (1922 °F) : 1196|12|1|3
    SSCC   (N):    0.1/s : tested at 1150 °C (2102 °F) : 1196|12|1|4
    SSCC   (N):    1/s : tested at 750 °C (1382 °F) : 1196|12|2|0
    SSCC   (N):    1/s : tested at 850 °C (1562 °F) : 1196|12|2|1
    SSCC   (N):    1/s : tested at 950 °C (1742 °F) : 1196|12|2|2
    SSCC   (N):    1/s : tested at 1050 °C (1922 °F) : 1196|12|2|3
    SSCC   (N):    1/s : tested at 1150 °C (2102 °F) : 1196|12|2|4
    SSCC   (N):    10/s : tested at 750 °C (1382 °F) : 1196|12|3|0
    SSCC   (N):    10/s : tested at 850 °C (1562 °F) : 1196|12|3|1
    SSCC   (N):    10/s : tested at 950 °C (1742 °F) : 1196|12|3|2
    SSCC   (N):    10/s : tested at 1050 °C (1922 °F) : 1196|12|3|3
    SSCC   (N):    10/s : tested at 1150 °C (2102 °F) : 1196|12|3|4

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Be₃N₂

    RIW    (N):    measured in vacuum : tested at 20 °C (68 °F) : 14675|45|0|0

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Beryllium

    RIW    (N):    measured in vacuum : tested at 20 °C (68 °F) : 835|45|0|0

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Bi₀.₅Sb₁.₅Te₃

    RHO    (R):    solid : 3283|2|0|-1
    SIGMA  (R):    solid : 3283|10|0|-1
    S      (N):    solid : 3283|48|0|-1

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Bi₂Te₁.₉₅Se₁.₀₅

    S      (N):    solid : 14646|48|0|-1

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Bi₂Te₂.₀₁Se₀.₉₉

    S      (N):    solid : 14645|48|0|-1

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Bi₂Te₂.₁Se₀.₉

    S      (N):    solid : 14644|48|0|-1

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Bi₂Te₂.₂₅S₀.₇₅ (New)

    TC        :    solid : Hall carrier concentration of 1.7 x 10¹⁸/cm3 : 14623|1|0|0
    RHO       :    solid : Hall carrier concentration of 1.7 x 10¹⁸/cm3 : 14623|2|0|0
    SH        :    solid : Hall carrier concentration of 1.7 x 10¹⁸/cm3 : 14623|9|0|0
    SIGMA     :    solid : Hall carrier concentration of 1.7 x 10¹⁸/cm3 : 14623|10|0|0
    S         :    solid : Hall carrier concentration of 1.7 x 10¹⁸/cm3 : 14623|48|0|0

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Bi₂Te₂.₄Se₀.₆

    TC     (N):    un-doped : parallel to pressing direction : 15420|1|0|0
    TC     (N):    un-doped : perpendicular to pressing direction : 15420|1|0|1
    TC     (N):    un-doped : average : 15420|1|0|2
    TC     (N):    0.3 at% chlorine doped : parallel to pressing direction : 15420|1|1|0
    TC     (N):    0.3 at% chlorine doped : perpendicular to pressing direction : 15420|1|1|1
    TC     (N):    0.3 at% chlorine doped : average : 15420|1|1|2
    TC     (N):    0.6 at% chlorine doped : parallel to pressing direction : 15420|1|2|0
    TC     (N):    0.6 at% chlorine doped : perpendicular to pressing direction : 15420|1|2|1
    TC     (N):    0.6 at% chlorine doped : average : 15420|1|2|2
    S      (N):    un-doped : parallel to pressing direction : 15420|48|0|0
    S      (N):    un-doped : perpendicular to pressing direction : 15420|48|0|1
    S      (N):    un-doped : average : 15420|48|0|2
    S      (N):    0.3 at% chlorine doped : parallel to pressing direction : 15420|48|1|0
    S      (N):    0.3 at% chlorine doped : perpendicular to pressing direction : 15420|48|1|1
    S      (N):    0.3 at% chlorine doped : average : 15420|48|1|2
    S      (N):    0.6 at% chlorine doped : parallel to pressing direction : 15420|48|2|0
    S      (N):    0.6 at% chlorine doped : perpendicular to pressing direction : 15420|48|2|1
    S      (N):    0.6 at% chlorine doped : average : 15420|48|2|2

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Bi₂Te₂.₅₅Se₀.₄₅

    S      (N):    solid : 14643|48|0|-1

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Bi₂Te₂.₅S₀.₅ (New)

    TC        :    solid : Hall carrier concentration of 1.9 x 10¹⁸/cm3 : 15419|1|0|0
    RHO       :    solid : Hall carrier concentration of 1.9 x 10¹⁸/cm3 : 15419|2|0|0
    SH        :    solid : Hall carrier concentration of 1.9 x 10¹⁸/cm3 : 15419|9|0|0
    SIGMA     :    solid : Hall carrier concentration of 1.9 x 10¹⁸/cm3 : 15419|10|0|0
    S         :    solid : Hall carrier concentration of 1.9 x 10¹⁸/cm3 : 15419|48|0|0

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Bi₂Te₂.₇₅S₀.₂₅ (New)

    TC        :    intrinsic material : Hall carrier concentration of 1.2 x 10¹⁹/cm3 : 15418|1|0|0
    TC        :    iodine doped : 0.005 mol iodine, Hall carrier concentration of 1.7 x 10¹⁹/cm3 : 15418|1|1|0
    TC        :    iodine doped : 0.01 mol iodine, Hall carrier concentration of 4.1 x 10¹⁹/cm3 : 15418|1|1|1
    TC        :    iodine doped : 0.02 mol iodine, Hall carrier concentration of 4.3 x 10¹⁹/cm3 : 15418|1|1|2
    RHO       :    intrinsic material : Hall carrier concentration of 1.2 x 10¹⁹/cm3 : 15418|2|0|0
    RHO       :    iodine doped : 0.005 iodine, mol Hall carrier concentration of 1.7 x 10¹⁹/cm3 : 15418|2|1|0
    RHO       :    iodine doped : 0.01 mol iodine, Hall carrier concentration of 4.1 x 10¹⁹/cm3 : 15418|2|1|1
    RHO       :    iodine doped : 0.02 mol iodine, Hall carrier concentration of 4.3 x 10¹⁹/cm3 : 15418|2|1|2
    SH        :    intrinsic material : Hall carrier concentration of 1.2 x 10¹⁹/cm3 : 15418|9|0|0
    SIGMA     :    intrinsic material : Hall carrier concentration of 1.2 x 10¹⁹/cm3 : 15418|10|0|0
    SIGMA     :    iodine doped : 0.005 iodine, mol Hall carrier concentration of 1.7 x 10¹⁹/cm3 : 15418|10|1|0
    SIGMA     :    iodine doped : 0.01 mol iodine, Hall carrier concentration of 4.1 x 10¹⁹/cm3 : 15418|10|1|1
    SIGMA     :    iodine doped : 0.02 mol iodine, Hall carrier concentration of 4.3 x 10¹⁹/cm3 : 15418|10|1|2
    S         :    intrinsic material : Hall carrier concentration of 1.2 x 10¹⁹/cm3 : 15418|48|0|0
    S         :    iodine doped : 0.005 mol iodine, Hall carrier concentration of 1.7 x 10¹⁹/cm3 : 15418|48|1|0
    S         :    iodine doped : 0.01 mol iodine, Hall carrier concentration of 4.1 x 10¹⁹/cm3 : 15418|48|1|1
    S         :    iodine doped : 0.02 mol iodine, Hall carrier concentration of 4.3 x 10¹⁹/cm3 : 15418|48|1|2

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Bi₂Te₂.₇Se₀.₃

    TC     (N):    0.3 at% chlorine doped : parallel to pressing direction : 14642|1|2|0
    TC     (N):    0.3 at% chlorine doped : perpendicular to pressing direction : 14642|1|2|1
    TC     (N):    0.3 at% chlorine doped : average : 14642|1|2|2
    TC     (N):    0.6 at% chlorine doped : parallel to pressing direction : 14642|1|3|0
    TC     (N):    0.6 at% chlorine doped : perpendicular to pressing direction : 14642|1|3|1
    TC     (N):    0.6 at% chlorine doped : average : 14642|1|3|2
    S      (N):    undoped : 14642|48|0|-1
    S      (N):    La2O3 doped : 0.5 wt% La2O3 : 14642|48|1|0
    S      (N):    La2O3 doped : 1 wt% La2O3 : 14642|48|1|1
    S      (N):    La2O3 doped : 1.5 wt% La2O3 : 14642|48|1|2
    S      (N):    0.3 at% chlorine doped : parallel to pressing direction : 14642|48|2|0
    S      (N):    0.3 at% chlorine doped : perpendicular to pressing direction : 14642|48|2|1
    S      (N):    0.3 at% chlorine doped : average : 14642|48|2|2
    S      (N):    0.6 at% chlorine doped : parallel to pressing direction : 14642|48|3|0
    S      (N):    0.6 at% chlorine doped : perpendicular to pressing direction : 14642|48|3|1
    S      (N):    0.6 at% chlorine doped : average : 14642|48|3|2

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Bi₂Te₂S (New)

    TC        :    solid : Hall carrier concentration of 2.7 x 10¹⁸/cm3 : 2479|1|0|0
    RHO       :    solid : Hall carrier concentration of 2.7 x 10¹⁸/cm3 : 2479|2|0|0
    SH        :    solid : Hall carrier concentration of 2.7 x 10¹⁸/cm3 : 2479|9|0|0
    SIGMA     :    solid : Hall carrier concentration of 2.7 x 10¹⁸/cm3 : 2479|10|0|0
    S         :    solid : Hall carrier concentration of 2.7 x 10¹⁸/cm3 : 2479|48|0|0

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Bi₂Te₃ - 0.01 CuI - 0.005 Pb (New)

    TC        :    solid : 15428|1|0|-1
    RHO       :    solid : 15428|2|0|-1
    SIGMA     :    solid : 15428|10|0|-1
    S         :    solid : 15428|48|0|-1

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Bi₂Te₃ - 0.01 CuI (New)

    TC        :    solid : 15433|1|0|-1
    RHO       :    solid : 15433|2|0|-1
    SIGMA     :    solid : 15433|10|0|-1
    S         :    solid : 15433|48|0|-1

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Bi₂Te₃ - 0.01 FeTe₂ (New)

    TC        :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15424|1|0|0
    RHO       :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15424|2|0|0
    SIGMA     :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15424|10|0|0
    S         :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15424|48|0|0

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Bi₂Te₃ - 0.02 FeTe₂ (New)

    TC        :    un-doped : carrier concentration of 5.6 x 10¹⁹/cm3 : 15425|1|0|0
    TC        :    Cu doped : doped with 0.005 mol Cu : 15425|1|1|0
    TC        :    Cu doped : doped with 0.0075 mol Cu : 15425|1|1|1
    TC        :    Cu doped : doped with 0.01 mol Cu : 15425|1|1|2
    TC        :    Cu doped : doped with 0.0125 mol Cu : 15425|1|1|3
    TC        :    Cu doped : doped with 0.015 mol Cu : 15425|1|1|4
    TC        :    Cu doped : doped with 0.02 mol Cu : 15425|1|1|5
    RHO       :    un-doped : carrier concentration of 5.6 x 10¹⁹/cm3 : 15425|2|0|0
    RHO       :    Cu doped : doped with 0.005 mol Cu : 15425|2|1|0
    RHO       :    Cu doped : doped with 0.0075 mol Cu : 15425|2|1|1
    RHO       :    Cu doped : doped with 0.01 mol Cu : 15425|2|1|2
    RHO       :    Cu doped : doped with 0.0125 mol Cu : 15425|2|1|3
    RHO       :    Cu doped : doped with 0.015 mol Cu : 15425|2|1|4
    RHO       :    Cu doped : doped with 0.02 mol Cu : 15425|2|1|5
    SIGMA     :    un-doped : carrier concentration of 5.6 x 10¹⁹/cm3 : 15425|10|0|0
    SIGMA     :    Cu doped : doped with 0.005 mol Cu : 15425|10|1|0
    SIGMA     :    Cu doped : doped with 0.0075 mol Cu : 15425|10|1|1
    SIGMA     :    Cu doped : doped with 0.01 mol Cu : 15425|10|1|2
    SIGMA     :    Cu doped : doped with 0.0125 mol Cu : 15425|10|1|3
    SIGMA     :    Cu doped : doped with 0.015 mol Cu : 15425|10|1|4
    SIGMA     :    Cu doped : doped with 0.02 mol Cu : 15425|10|1|5
    S         :    un-doped : carrier concentration of 5.6 x 10¹⁹/cm3 : 15425|48|0|0
    S         :    Cu doped : doped with 0.005 mol Cu : 15425|48|1|0
    S         :    Cu doped : doped with 0.0075 mol Cu : 15425|48|1|1
    S         :    Cu doped : doped with 0.01 mol Cu : 15425|48|1|2
    S         :    Cu doped : doped with 0.0125 mol Cu : 15425|48|1|3
    S         :    Cu doped : doped with 0.015 mol Cu : 15425|48|1|4
    S         :    Cu doped : doped with 0.02 mol Cu : 15425|48|1|5

return to listing



Bi₂Te₃ - 0.03 CuI - 0.015 Pb (New)

    TC        :    solid : 15429|1|0|-1
    RHO       :    solid : 15429|2|0|-1
    SIGMA     :    solid : 15429|10|0|-1
    S         :    solid : 15429|48|0|-1

return to listing



Bi₂Te₃ - 0.03 FeTe₂ (New)

    TC        :    solid : carrier concentration of 5.5 x 10¹⁹/cm3 : 15426|1|0|0
    RHO       :    solid : carrier concentration of 5.5 x 10¹⁹/cm3 : 15426|2|0|0
    SIGMA     :    solid : carrier concentration of 5.5 x 10¹⁹/cm3 : 15426|10|0|0
    S         :    solid : carrier concentration of 5.5 x 10¹⁹/cm3 : 15426|48|0|0

return to listing



Bi₂Te₃ - 0.04 FeTe₂ (New)

    TC        :    solid : carrier concentration of 5 x 10¹⁹/cm3 : 15427|1|0|0
    RHO       :    solid : carrier concentration of 5 x 10¹⁹/cm3 : 15427|2|0|0
    SIGMA     :    solid : carrier concentration of 5 x 10¹⁹/cm3 : 15427|10|0|0
    S         :    solid : carrier concentration of 5 x 10¹⁹/cm3 : 15427|48|0|0

return to listing



Bi₂Te₃ - 0.05 CuI - 0.025 Pb (New)

    TC        :    solid : 15430|1|0|-1
    RHO       :    solid : 15430|2|0|-1
    SIGMA     :    solid : 15430|10|0|-1
    S         :    solid : 15430|48|0|-1

return to listing



Bi₂Te₃ - 0.07 CuI - 0.035 Pb (New)

    TC        :    solid : 15431|1|0|-1
    RHO       :    solid : 15431|2|0|-1
    SIGMA     :    solid : 15431|10|0|-1
    S         :    solid : 15431|48|0|-1

return to listing



Bi₂Te₃ - 0.1 CuI - 0.05 Pb (New)

    TC        :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15432|1|0|0
    RHO       :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15432|2|0|0
    SIGMA     :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15432|10|0|0
    S         :    solid : carrier concentration of 5.7 x 10¹⁹/cm3 : 15432|48|0|0

return to listing



Bi₂Te₃

    TC     (N):    solid : Wang et. al. : 3284|1|0|0
    TC     (N):    solid : Yamini et. al., Hall carrier concentration of 1 x 10¹⁹/cm3 : 3284|1|0|1
    TC     (N):    solid : Rahman et. al., carrier concentration of 5.9 x 10¹⁹/cm3 : 3284|1|0|2
    TC     (N):    solid : Han et. al., carrier concentration of 1.2 x 10¹⁹/cm3 : 3284|1|0|3
    TC     (N):    solid : average of Han, Wang, and Yamini : 3284|1|0|4
    RHO    (N):    bulk material : Yamini et. al., carrier concentration of 1 x 10¹⁹/cm3 : 3284|2|0|1
    RHO    (N):    bulk material : Rahman et. al., carrier concentration of 5.9 x 10¹⁹/cm3 : 3284|2|0|2
    RHO    (N):    bulk material : Han et. al., carrier concentration of 1.2 x 10¹⁹/cm3 : 3284|2|0|3
    RHO    (N):    thin film : 16 nm thick : 3284|2|1|0
    RHO    (N):    thin film : 30 nm thick : 3284|2|1|1
    RHO    (N):    thin film : 35 nm thick : 3284|2|1|2
    RHO    (N):    thin film : 70 nm thick : 3284|2|1|3
    RHO    (N):    thin film : 85 nm thick : 3284|2|1|4
    RHO    (N):    thin film : 106 nm thick : 3284|2|1|5
    RHO    (N):    thin film : 154 nm thick : 3284|2|1|6
    SIGMA  (N):    bulk material : Yamini et. al., carrier concentration of 1 x 10¹⁹/cm3 : 3284|10|0|1
    SIGMA  (N):    bulk material : Rahman et. al., carrier concentration of 5.9 x 10¹⁹/cm3 : 3284|10|0|2
    SIGMA  (N):    bulk material : Han et. al., carrier concentration of 1.2 x 10¹⁹/cm3 : 3284|10|0|3
    SIGMA  (N):    thin film : 16 nm thick : 3284|10|1|0
    SIGMA  (N):    thin film : 30 nm thick : 3284|10|1|1
    SIGMA  (N):    thin film : 35 nm thick : 3284|10|1|2
    SIGMA  (N):    thin film : 70 nm thick : 3284|10|1|3
    SIGMA  (N):    thin film : 85 nm thick : 3284|10|1|4
    SIGMA  (N):    thin film : 106 nm thick : 3284|10|1|5
    SIGMA  (N):    thin film : 154 nm thick : 3284|10|1|6
    TD     (N):    solid : Yamini et. al., Hall carrier concentration of 1 x 10¹⁹/cm3 : 3284|25|0|1
    TD     (N):    solid : average : 3284|25|0|2
    S      (N):    bulk material : Wang et. al. : 3284|48|0|0
    S      (N):    bulk material : Yamini et. al., Hall carrier concentration of 1 x 10¹⁹/cm3 : 3284|48|0|1
    S      (N):    bulk material : Rahman et. al., carrier concentration of 5.9 x 10¹⁹/cm3 : 3284|48|0|2
    S      (N):    bulk material : Han et. al., carrier concentration of 1.2 x 10¹⁹/cm3 : 3284|48|0|3
    S     (N*):    thin film : 16 nm thick : 3284|48|1|0
    S     (N*):    thin film : 30 nm thick : 3284|48|1|1
    S     (N*):    thin film : 35 nm thick : 3284|48|1|2
    S     (N*):    thin film : 70 nm thick : 3284|48|1|3
    S     (N*):    thin film : 85 nm thick : 3284|48|1|4
    S     (N*):    thin film : 106 nm thick : 3284|48|1|5
    S     (N*):    thin film : 154 nm thick : 3284|48|1|6

return to listing



Ce₀.₀₆Fe₀.₄₉Co₃.₅₁Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1629|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1629|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1629|48|0|0

return to listing



Ce₀.₀₈Fe₀.₃₉Co₃.₆₁Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1631|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1631|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1631|48|0|0

return to listing



Ce₀.₀₈Fe₀.₉Co₃.₁Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1630|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1630|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1630|48|0|0

return to listing



Ce₀.₁₂Fe₀.₇₁Co₃.₂₉Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1632|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1632|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1632|48|0|0

return to listing



Copper

    S      (N):    solid : 863|48|0|-1

return to listing



CoSb₃ + 2 wt% PbTe composite (New)

    TC        :    solid : spark plasma sintered, > 98% dense : 15421|1|0|0
    RHO       :    solid : spark plasma sintered, > 98% dense : 15421|2|0|0
    SIGMA     :    solid : spark plasma sintered, > 98% dense : 15421|10|0|0
    S         :    solid : spark plasma sintered, > 98% dense : 15421|48|0|0

return to listing



CoSb₃ + 4 wt% PbTe composite (New)

    TC        :    solid : spark plasma sintered, > 98% dense : 15422|1|0|0
    RHO       :    solid : spark plasma sintered, > 98% dense : 15422|2|0|0
    SIGMA     :    solid : spark plasma sintered, > 98% dense : 15422|10|0|0
    S         :    solid : spark plasma sintered, > 98% dense : 15422|48|0|0

return to listing



CoSb₃ + 8 wt% PbTe composite (New)

    TC        :    solid : spark plasma sintered, > 98% dense : 15423|1|0|0
    RHO       :    solid : spark plasma sintered, > 98% dense : 15423|2|0|0
    SIGMA     :    solid : spark plasma sintered, > 98% dense : 15423|10|0|0
    S         :    solid : spark plasma sintered, > 98% dense : 15423|48|0|0

return to listing



CoSb₃

    TC     (N):    solid : spark plasma sintered, > 98% dense : 1620|1|0|3
    TC     (N):    solid : average of plasma activated sintered samples : 1620|1|0|4
    RHO    (N):    solid : plasma activated sintered, 98% dense : 1620|2|0|2
    RHO    (N):    solid : spark plasma sintered, > 98% dense : 1620|2|0|3
    RHO    (N):    solid : average of plasma activated sintered samples : 1620|2|0|4
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1620|10|0|2
    SIGMA  (N):    solid : spark plasma sintered, > 98% dense : 1620|10|0|3
    SIGMA  (N):    solid : average of plasma activated sintered samples : 1620|10|0|4
    S      (N):    solid : plasma activated sintered, 98% dense : 1620|48|0|0

return to listing



Cu₀.₈CrS₂.₃ (New)

    RHO       :    solid : 80% to 85% dense : 15445|2|0|0
    SIGMA     :    solid : 80% to 85% dense : 15445|10|0|0
    S         :    solid : 80% to 85% dense : 15445|48|0|0

return to listing



Cu₀.₉CrS₂.₄ (New)

    TC        :    solid : 80% to 85% dense : 15444|1|0|0
    RHO       :    solid : 80% to 85% dense : 15444|2|0|0
    SIGMA     :    solid : 80% to 85% dense : 15444|10|0|0
    S         :    solid : 80% to 85% dense : 15444|48|0|0

return to listing



Cu₃BiS₃

    S      (N):    solid : 9478|48|0|-1

return to listing



CuCo₂S₄

    S     (N*):    solid : 14619|48|0|-1

return to listing



CuCrS₂.₁ (New)

    TC        :    solid : 80% to 85% dense : 15442|1|0|0
    RHO       :    solid : 80% to 85% dense : 15442|2|0|0
    SIGMA     :    solid : 80% to 85% dense : 15442|10|0|0
    S         :    solid : 80% to 85% dense : 15442|48|0|0

return to listing



CuCrS₂.₂ (New)

    TC        :    solid : 80% to 85% dense : 15443|1|0|0
    RHO       :    solid : 80% to 85% dense : 15443|2|0|0
    SIGMA     :    solid : 80% to 85% dense : 15443|10|0|0
    S         :    solid : 80% to 85% dense : 15443|48|0|0

return to listing



CuCrS₂ (New)

    TC        :    solid : 80% to 85% dense : 15441|1|0|0
    RHO       :    solid : 80% to 85% dense : 15441|2|0|0
    SIGMA     :    solid : 80% to 85% dense : 15441|10|0|0
    S         :    solid : 80% to 85% dense : 15441|48|0|0

return to listing



Fe₀.₅₁Co₃.₄₉Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1627|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1627|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1627|48|0|0

return to listing



Fe₀.₉₂Co₃.₀₈Sb₁₂

    RHO    (N):    solid : plasma activated sintered, 98% dense : 1628|2|0|0
    SIGMA  (N):    solid : plasma activated sintered, 98% dense : 1628|10|0|0
    S      (N):    solid : plasma activated sintered, 98% dense : 1628|48|0|0

return to listing



Ge₂Sb₂Te₅

    RHO    (N):    solid : thin film : 14594|2|0|1
    SIGMA  (N):    solid : thin film : 14594|10|0|1

return to listing



GeTe (New)

    RHO       :    solid : thin film : 15416|2|0|0
    SH        :    solid : 15416|9|0|-1
    SIGMA     :    solid : thin film : 15416|10|0|0
    HC        :    solid : 15416|17|0|-1

return to listing



Gold

    S      (N):    solid : 913|48|0|-1

return to listing



Inconel 601

    SR     (R):    solution treated : tested at 538 °C (1000 °F) : 1857|22|1|0
    SR     (R):    solution treated : tested at 593 °C (1100 °F) : 1857|22|1|1
    SR     (R):    solution treated : tested at 649 °C (1200 °F) : 1857|22|1|2
    SR     (R):    solution treated : tested at 704 °C (1300 °F) : 1857|22|1|3
    SR     (R):    solution treated : tested at 760 °C (1400 °F) : 1857|22|1|4
    SR     (R):    solution treated : tested at 816 °C (1500 °F) : 1857|22|1|5
    SR     (R):    solution treated : tested at 871 °C (1600 °F) : 1857|22|1|6
    SR     (R):    solution treated : tested at 982 °C (1800 °F) : 1857|22|1|7
    SR     (R):    solution treated : tested at 1093 °C (2000 °F) : 1857|22|1|8
    SR     (R):    solution treated : tested at 1149 °C (2100 °F) : 1857|22|1|9
    SR     (R):    solution treated : Master curve (LMP), 593 °C (1100 °F) and below : 1857|22|1|10
    SR     (R):    solution treated : Master curve (LMP), 593 °C (1100 °F) to 649 °C (1200 °F) : 1857|22|1|11
    SR     (R):    solution treated : Master curve (LMP), 649 °C (1200 °F) and above : 1857|22|1|12

return to listing



Mg₁.₉₇Li₀.₀₃Si₀.₃Sn₀.₇

    S     (N*):    solid : 15194|48|0|-1

return to listing



Mg₂.₀₆Si₀.₃Sn₀.₆₆₅Bi₀.₀₃₅

    S     (N*):    solid : 15196|48|0|-1

return to listing



Mg₂.₀₆Si₀.₃Sn₀.₆₉₂₅Bi₀.₀₀₇₅

    S     (N*):    solid : 15195|48|0|-1

return to listing



Mg₂Si₀.₅Ge₀.₅ (New)

    TC        :    solid : 15446|1|0|-1
    RHO       :    solid : 15446|2|0|-1
    SIGMA     :    solid : 15446|10|0|-1
    S         :    solid : 15446|48|0|-1

return to listing



Mg₂Si₀.₅Ge₀.₅Sb₀.₀₀₅ (New)

    TC        :    solid : 15447|1|0|-1
    RHO       :    solid : 15447|2|0|-1
    SIGMA     :    solid : 15447|10|0|-1
    S         :    solid : 15447|48|0|-1

return to listing



Mg₂Si₀.₅Ge₀.₅Sb₀.₀₁ (New)

    TC        :    solid : 15448|1|0|-1
    RHO       :    solid : 15448|2|0|-1
    SIGMA     :    solid : 15448|10|0|-1
    S         :    solid : 15448|48|0|-1

return to listing



Mg₂Si₀.₅Ge₀.₅Sb₀.₀₂ (New)

    TC        :    solid : 15449|1|0|-1
    RHO       :    solid : 15449|2|0|-1
    SIGMA     :    solid : 15449|10|0|-1
    S         :    solid : 15449|48|0|-1

return to listing



Mg₂Si₀.₅Ge₀.₅Sb₀.₀₃ (New)

    TC        :    solid : 15450|1|0|-1
    RHO       :    solid : 15450|2|0|-1
    SIGMA     :    solid : 15450|10|0|-1
    S         :    solid : 15450|48|0|-1

return to listing



Mn₃CuN (New)

    DLL       :    solid : antiperovskite : 15415|0|0|0
    MTE       :    solid : antiperovskite : 15415|8|0|0

return to listing



Mn₃Ga₀.₇Sn₀.₃N (New)

    DLL       :    solid : antiperovskite : 15413|0|0|0
    RHO       :    solid : antiperovskite : 15413|2|0|0
    MTE       :    solid : antiperovskite : 15413|8|0|0
    SIGMA     :    solid : antiperovskite : 15413|10|0|0

return to listing



Mn₃InN (New)

    RHO       :    solid : cubic : 15414|2|0|0
    SH        :    solid : 15414|9|0|-1
    SIGMA     :    solid : cubic : 15414|10|0|0
    HC        :    solid : 15414|17|0|-1

return to listing



Molybdenum

    S      (N):    solid : 876|48|0|-1

return to listing



NaZnSb

    S     (N*):    solid : 15181|48|0|-1

return to listing



p-type Si₈₀Ge₂₀

    TC     (R):    solid : 2542|1|0|-1
    RHO    (N):    solid : thin film : 2542|2|0|0
    SIGMA  (N):    solid : thin film : 2542|10|0|0
    TD     (R):    solid : 2542|25|0|-1
    S      (N):    solid : 2542|48|0|-1

return to listing



Palladium

    S      (N):    solid : 880|48|0|-1

return to listing



PbTe

    TC     (N):    single crystal nano wire : 75 nm diameter : 2515|1|0|0
    TC    (N*):    single crystal nano wire : 182 nm diameter : 2515|1|0|1
    TC    (N*):    single crystal nano wire : 277 nm diameter : 2515|1|0|2
    TC    (N*):    single crystal nano wire : 436 nm diameter : 2515|1|0|3
    RHO    (N):    single crystal nano wire : 75 nm diameter : 2515|2|0|0
    RHO    (N):    spark plasma sintered : sintered at 300 °C (572 °F) : 2515|2|1|0
    RHO    (N):    spark plasma sintered : sintered at 350 °C (662 °F) : 2515|2|1|1
    RHO    (N):    spark plasma sintered : sintered at 400 °C (752 °F) : 2515|2|1|2
    SIGMA  (N):    single crystal nano wire : 75 nm diameter : 2515|10|0|0
    SIGMA  (N):    spark plasma sintered : sintered at 300 °C (572 °F) : 2515|10|1|0
    SIGMA  (N):    spark plasma sintered : sintered at 350 °C (662 °F) : 2515|10|1|1
    SIGMA  (N):    spark plasma sintered : sintered at 400 °C (752 °F) : 2515|10|1|2
    TD     (N):    single crystal nano wire : 75 nm diameter : 2515|25|0|0
    S      (N):    single crystal nano wire : 75 nm diameter : 2515|48|0|0
    S      (N):    spark plasma sintered : sintered at 300 °C (572 °F) : 2515|48|1|0
    S      (N):    spark plasma sintered : sintered at 350 °C (662 °F) : 2515|48|1|1
    S      (N):    spark plasma sintered : sintered at 400 °C (752 °F) : 2515|48|1|2

return to listing



Platinum

    S      (N):    solid : 912|48|0|-1

return to listing



Sb₂Te₃

    TC     (N):    thin film : magnetron sputtered, measured parallel to the deposition plane : 14622|1|0|0
    TC     (N):    thin film : magnetron sputtered, measured perpendicular to the deposition plane : 14622|1|0|1
    RHO    (N):    thin film : magnetron sputtered, measured parallel to the deposition plane : 14622|2|0|1
    RHO    (N):    thin film : magnetron sputtered, measured perpendicular to the deposition plane : 14622|2|0|2
    RHO    (N):    single crystal : no magnetic field : 14622|2|1|0
    RHO    (N):    single crystal : 1 T magnetic field : 14622|2|1|1
    RHO    (N):    single crystal : 3 T magnetic field : 14622|2|1|2
    RHO    (N):    single crystal : 5 T magnetic field : 14622|2|1|3
    SH     (N):    solid : 14622|9|0|-1
    SIGMA  (N):    thin film : magnetron sputtered, measured parallel to the deposition plane : 14622|10|0|1
    SIGMA  (N):    thin film : magnetron sputtered, measured perpendicular to the deposition plane : 14622|10|0|2
    SIGMA  (N):    single crystal : no magnetic field : 14622|10|1|0
    SIGMA  (N):    single crystal : 1 T magnetic field : 14622|10|1|1
    SIGMA  (N):    single crystal : 3 T magnetic field : 14622|10|1|2
    SIGMA  (N):    single crystal : 5 T magnetic field : 14622|10|1|3
    HC     (N):    solid : 14622|17|0|-1
    TD     (N):    thin film : magnetron sputtered, measured parallel to the deposition plane : 14622|25|0|0
    TD     (N):    thin film : magnetron sputtered, measured perpendicular to the deposition plane : 14622|25|0|1
    S      (N):    thin film : magnetron sputtered, measured parallel to the deposition plane : 14622|48|0|0
    S      (N):    thin film : magnetron sputtered, measured perpendicular to the deposition plane : 14622|48|0|1

return to listing



Seawater

    RHO    (R):    liquid, dilute synthetic seawater : 0.02 eq. Cl ppm (0.71 ppm Cl, 1.29 ppm salt) : 3428|2|1|0
    RHO    (R):    liquid, dilute synthetic seawater : 0.06 eq. Cl ppm (2.13 ppm Cl, 3.87 ppm salt) : 3428|2|1|1
    RHO    (R):    liquid, dilute synthetic seawater : 0.1 eq. Cl ppm (3.55 ppm Cl, 6.45 ppm salt) : 3428|2|1|2
    RHO    (R):    liquid, dilute synthetic seawater : 0.15 eq. Cl ppm (5.33 ppm Cl, 9.68 ppm salt) : 3428|2|1|3
    RHO    (R):    liquid, dilute synthetic seawater : 0.3 eq. Cl ppm (10.7 ppm Cl, 19.4 ppm salt) : 3428|2|1|4
    RHO    (R):    liquid, dilute synthetic seawater : 0.5 eq. Cl ppm (17.8 ppm Cl, 32.3 ppm salt) : 3428|2|1|5
    RHO    (R):    liquid, dilute synthetic seawater : 1.0 eq. Cl ppm (35.5 ppm Cl, 64.5 ppm salt) : 3428|2|1|6
    RHO    (R):    liquid, dilute synthetic seawater : 1.5 eq. Cl ppm (53.3 ppm Cl, 96.8 ppm salt) : 3428|2|1|7
    RHO    (R):    liquid, dilute synthetic seawater : 2.5 eq. Cl ppm (88.8 ppm Cl, 161 ppm salt) : 3428|2|1|8
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.02 eq. Cl ppm (0.71 ppm Cl, 1.29 ppm salt) : 3428|10|1|0
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.06 eq. Cl ppm (2.13 ppm Cl, 3.87 ppm salt) : 3428|10|1|1
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.1 eq. Cl ppm (3.55 ppm Cl, 6.45 ppm salt) : 3428|10|1|2
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.15 eq. Cl ppm (5.33 ppm Cl, 9.68 ppm salt) : 3428|10|1|3
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.3 eq. Cl ppm (10.7 ppm Cl, 19.4 ppm salt) : 3428|10|1|4
    SIGMA  (R):    liquid, dilute synthetic seawater : 0.5 eq. Cl ppm (17.8 ppm Cl, 32.3 ppm salt) : 3428|10|1|5
    SIGMA  (R):    liquid, dilute synthetic seawater : 1.0 eq. Cl ppm (35.5 ppm Cl, 64.5 ppm salt) : 3428|10|1|6
    SIGMA  (R):    liquid, dilute synthetic seawater : 1.5 eq. Cl ppm (53.3 ppm Cl, 96.8 ppm salt) : 3428|10|1|7
    SIGMA  (R):    liquid, dilute synthetic seawater : 2.5 eq. Cl ppm (88.8 ppm Cl, 161 ppm salt) : 3428|10|1|8

return to listing



Silver

    S      (N):    solid : 881|48|0|-1

return to listing



Stellite 27

    DLL    (N):    solid : 467|0|0|-1
    MTE    (N):    solid : 467|8|0|-1
    CTE    (N):    solid : 467|16|0|-1
    D      (R):    solid : 467|24|0|-1

return to listing



Stellite 31

    DLL    (R):    solid : 469|0|0|-1
    RHO   (N*):    solid : 469|2|0|-1
    UTS   (N*):    solid : 469|5|0|-1
    MTE    (R):    solid : 469|8|0|-1
    SIGMA (N*):    solid : 469|10|0|-1
    YS    (N*):    solid : 469|13|0|-1
    CTE    (N):    solid : 469|16|0|-1
    D      (R):    solid : 469|24|0|-1
    %El   (N*):    solid : 469|29|0|-1

return to listing



Stellite 3

    DLL    (R):    solid : 14907|0|0|-1
    MTE    (R):    solid : 14907|8|0|-1
    D      (R):    solid : 14907|24|0|-1

return to listing



Ti₁₀Ru₁₉B₈ (New)

    TC        :    solid : 15434|1|0|-1
    RHO       :    solid : 15434|2|0|-1
    SH        :    solid : 15434|9|0|-1
    SIGMA     :    solid : 15434|10|0|-1
    D     (*):    solid : 15434|24|0|-1
    TD        :    solid : 15434|25|0|-1
    S         :    solid : 15434|48|0|-1

return to listing



Ti₉Co₂Ru₁₈B₈ (New)

    TC        :    solid : 15438|1|0|-1
    RHO       :    solid : 15438|2|0|-1
    SH        :    solid : 15438|9|0|-1
    SIGMA     :    solid : 15438|10|0|-1
    D     (*):    solid : 15438|24|0|-1
    TD        :    solid : 15438|25|0|-1
    S         :    solid : 15438|48|0|-1

return to listing



Ti₉Cr₂Ru₁₈B₈ (New)

    TC        :    solid : 15435|1|0|-1
    RHO       :    solid : 15435|2|0|-1
    SH        :    solid : 15435|9|0|-1
    SIGMA     :    solid : 15435|10|0|-1
    D     (*):    solid : 15435|24|0|-1
    TD        :    solid : 15435|25|0|-1
    S         :    solid : 15435|48|0|-1

return to listing



Ti₉Cu₂Ru₁₈B₈ (New)

    TC        :    solid : 15440|1|0|-1
    RHO       :    solid : 15440|2|0|-1
    SH        :    solid : 15440|9|0|-1
    SIGMA     :    solid : 15440|10|0|-1
    D     (*):    solid : 15440|24|0|-1
    TD        :    solid : 15440|25|0|-1
    S         :    solid : 15440|48|0|-1

return to listing



Ti₉Fe₂Ru₁₈B₈ (New)

    TC        :    solid : 15437|1|0|-1
    RHO       :    solid : 15437|2|0|-1
    SH        :    solid : 15437|9|0|-1
    SIGMA     :    solid : 15437|10|0|-1
    D     (*):    solid : 15437|24|0|-1
    TD        :    solid : 15437|25|0|-1
    S         :    solid : 15437|48|0|-1

return to listing



Ti₉Mn₂Ru₁₈B₈ (New)

    TC        :    solid : 15436|1|0|-1
    RHO       :    solid : 15436|2|0|-1
    SH        :    solid : 15436|9|0|-1
    SIGMA     :    solid : 15436|10|0|-1
    D     (*):    solid : 15436|24|0|-1
    TD        :    solid : 15436|25|0|-1
    S         :    solid : 15436|48|0|-1

return to listing



Ti₉Ni₂Ru₁₈B₈ (New)

    TC        :    solid : 15439|1|0|-1
    RHO       :    solid : 15439|2|0|-1
    SH        :    solid : 15439|9|0|-1
    SIGMA     :    solid : 15439|10|0|-1
    D     (*):    solid : 15439|24|0|-1
    TD        :    solid : 15439|25|0|-1
    S         :    solid : 15439|48|0|-1

return to listing



TiS₂:Sn₀.₀₅

    S     (N*):    solid : 14591|48|0|-1

return to listing



TiS₂:Sn₀.₀₇₅

    S     (N*):    solid : 14592|48|0|-1

return to listing



TiS₂:Sn₀.₁

    S     (N*):    solid : 14593|48|0|-1

return to listing



TiS₂

    S     (N*):    solid : 14590|48|0|-1

return to listing



Tungsten

    S      (N):    solid : 908|48|0|-1

return to listing



UNS C10100 (OFE)

    S      (N):    solid : 734|48|0|-1

return to listing



UNS C10200 (OFHC/OF)

    S      (N):    solid : 735|48|0|-1

return to listing



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